Other Sources of Software and Data
Software
-
Compro (Common Data Analysis Processing System)
- from the Surface
Analysis Society of Japan
- Data Analysis (XPS, AES, Ellipsometry)
- from the Surface Science Division at Utrecht.
- Data Analysis (SIMS) (vn 1.1)
- from M. Karolewski, Nanyang T.U.
- eXPFit : an XPS peak fitting utility for Microsoft Excel
- from R.M. Nix, Queen Mary, London
- QUASES : for XPS/AES analysis of surface nano-structures
- from S. Tougaard, Odense
- Simion 3-D : an ion optics simulation program (demo only for download)
- from Ion Source Software
- MD
simulation of atomic collisions in metals and alloys
- from M. Karolewski, University of Alberta
-
Simulation Kit for Atomic Collisions in Solids (Win95-version 2.3)
- from M. Karolewski, University of Alberta
- SLIMS-MS 1.0 : a data acquisition program for mass spectrometers for multiple-ion monitoring in TPD experiments
-from S. Schroeder, F.U. Berlin.
- Spectral DataProcessor 2.0 : Windows based XPS spectral data processing software
- from XPS International, Inc.
- SpXZeigR Routines (vn. 3.0.6r) for Igor Pro : for spectral data analysis and presentation
- from J.J. Weimer, Alabama
- Surface Explorer : an interactive surface viewer on the web (see also BALSAC)
- from F. Rammer and K. Hermann , FHI.
- LEED Pattern Simulator
-from K. Hermann and M. A. Van Hove
- Direct Methods in 2D X-Ray Diffraction
-from L. D. Marks, North Western University
- fitXPS-XPS Fitting Program
-from David Adams, University of Aarhus
-
Chemistry Software Exchange A massive resource of chemistry related software
- Library of mathematical and statistical software
Databases
See also the On-line Databases Page of the UK ESCA Users Group